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≤60nm覆盖精度的纳米压印光刻技术

Nanoimprint Lithography with ≤60 nm Overlay Precision 

作者:Wei Wu, Robert G. Walmsley, Wen-Di Li, Xuema Li and R. Stanley Williams 作者单位:HP Laboratories 加工时间:2013-12-23 信息来源:HP 索取原文[17 页]
关键词:纳米压印;覆盖;光刻
摘 要:Nanoimprint lithography (NIL) is a high-resolution, high-throughput and cost-effective nano-patterning technology. However, the overlay accuracy is lagging behind the resolution because of the high cost of mechanical precision. We have built an inexpensive stand-alone machine based on the wafer bowing nanoimprint process, and demonstrated single-point overlay of two transferred pattern layers with an accuracy of ≤60 nm. 
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