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对内存应用程序的电阻式交换机的实验和模拟研究

Experimental and Simulation Study of Resistive Switches for Memory Applications

作者:Feng Pan 作者单位:University of California at Berkeley 加工时间:2013-11-21 信息来源:EECS 索取原文[117 页]
关键词:电阻;内存;RRAM
摘 要:In recent years, resistive random access memory (RRAM) has gained significant attention as one of the promising candidates for next generation memory applications. This is due to its anticipated advantages versus Flash technology with respect to high density, low power and fast read and write speed. The main operation mechanism of these devices is a resistance change induced by filament formation through metal-cations or oxygen vacancies.
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