关键词：芯片；激光器；加速器；介电性能
摘 要：We present a new concept for a beam position monitor with the unique ability to map particle beam position to a measurable wavelength. Coupled with an optical spectrograph, this beam position monitor is capable of sub-nanometer resolution. We describe one possible design, and through finite element frequency domain simulations, we show a resolution of 0.7 nanometers. Due to its high precision and ultra-compact form factor, this device is ideal for future x-ray sources and laser-driven particle accelerators 'on-a-chip'.