关键词：光学图案；晶片；检查系统；明场检查；暗场检测
摘 要：An optical patterned wafer inspection system is used to find defects in patterned wafers during the wafer manufacturing process. This system consists of two technologies, which are bright-field inspection and dark-field inspection. Optical patterned wafer inspection systems are generally used during the production flow of semiconductor ICs. Semiconductor wafer usage is prevalent over a vast number of industries, such as the consumer electronics, automotive, and industrial segments; therefore, the optical patterned wafer inspection system is bound to grow with the growth in these markets during the forecast period.
目 录：

PART 01: Executive summary

Highlights

PART 02: Scope of the report

Market overview

PART 03: Market research methodology

Research methodology

Economic indicators

PEST analysis

PART 04: Introduction

Key market highlights

PART 05: Technology landscape

Optical patterned wafer inspection system: how it

works

Comparison between optical and e-beam wafer

inspection equipment

PART 06: Market landscape

Market overview

Market size and forecast

Five forces analysis

PART 07: Geographical segmentation

Market overview

Market size and forecast

Global optical patterned wafer inspection equipment

market in APAC

Global optical patterned wafer inspection equipment

market in North America

Global optical patterned wafer inspection equipment

market in Europe

PART 08: Market drivers

PART 09: Impact of drivers

PART 10: Market challenges

PART 11: Impact of drivers and challenges

PART 12: Market trends

PART 13: Vendor landscape

Competitive scenario

Key Vendors

Other prominent vendors

PART 14: Key vendor analysis

Applied Materials

KLA-Tencor

PART 15: Key recommendations

PART 16: Appendix

List of abbreviations

PART 17: Explore Technavio