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Xilinx覆晶芯片专家包的物理失效分析:LP2填充不足和ATI盖胶材料的任务环境对性质的影响

Physics of Failure Analysis of Xilinx Flip Chip CCGA Packages: Effects of Mission Environments on Properties of LP2 Underfill and ATI Lid Adhesive Materials

作者:J. Suh 作者单位:Jet Propulsion Lab., Pasadena, CA. 加工时间:2015-09-09 信息来源:科技报告(DE) 索取原文[26 页]
关键词:芯片;可靠性;技术利用率
摘 要:The Xilinx Virtex 4QV and 5QV (V4 and V5) are next-generation field-programmable gate arrays (FPGAs) for space applications. However, there have been concerns within the space community regarding the non-hermeticity of V4/V5 packages; polymeric materials such as the underfill and lid adhesive will be directly exposed to the space environment. In this study, reliability concerns associated with the non-hermeticity of V4/V5 packages were investigated by studying properties and behavior of the underfill and the lid adhesvie materials used in V4/V5 packages.
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