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用于计量检测弱光动力性能的潮湿的热应力测试中湿热应激晶体硅组件发生潜在退化的原位测量

In-Situ Measurement of Crystalline Silicon Modules Undergoing Potential-Induced Degradation in Damp Heat Stress Testing for Estimation of Low-Light Power Performance
作者:Hacke, P.Terwilliger, K.Kurtz, S. 加工时间:2014-09-25 信息来源:科技报告(DE) 索取原文[10 页]
关键词:硅;太阳能;电力系统;电源供应器
摘 要:We seek to forecast the lifetime of modules in the field using accelerated testing. Collection of sufficient data from modules undergoing indoor accelerated lifetime testing to enable statistical analyses and lifetime predictions has been difficult, and data are lacking. Measurement of power degradation generally involves intermittently removing the module from the environmental chamber and measuring power on a solar simulator, which is a time-consuming process when numerous samples are involved. Methods are therefore sought to characterize the state of degradation of the module in-situ during stress testing.
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