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全球扫描电子显微镜市场报告(2016-2020年)

Global Scanning Electron Microscope Market 2016-2020

加工时间:2016-04-25 信息来源:EMIS 索取原文[54 页]
关键词:光学显微镜;波长的限制;研究原子;结构和安排;分辨率
摘 要:The capacity of an optical microscope is limited by the wavelength of the light used to see the object. When it comes to studying the structure and arrangement of atoms and molecules, optical microscopes fall short because their resolution is limited by the wavelength of light. In 1931, Max Knoll and Ernst Ruska invented the electron microscope. They used electrons to view objects through a microscope instead of optical light. As electrons have wavelengths that can be measured in angstroms, they are able to overcome the barriers of optical microscopes, thus proving highly beneficial for researchers viewing samples at the nanoscale.
目 录:

PART 01: Executive summary

Highlights

PART 02: Scope of the report

Definitions

Market size calculation

Base year

Geographical segmentation

Vendor segmentation

Top-vendor offerings

PART 03: Market research methodology

Research methodology

Economic indicators

PART 04: Introduction

Key market highlights

PART 05: Market landscape

Market overview

Sample holders

Wafer inspection equipment

Market size and forecast

Five forces analysis

PART 06: Market segmentation by end-user

Semiconductors

Life sciences

Materials science

Nanotechnology

PART 07: Geographical segmentation

APAC

Americas

EMEA

PART 08: Market drivers

Root-cause failure analysis

Increased demand for FEG SEMs

Growing nanotechnology research

PART 09: Impact of drivers

PART 10: Market challenges

High product cost

Long lead time

Limitations of SEMs

Long replacement cycles

PART 11: Impact of drivers and challenges

PART 12: Market trends

Increased demand for low-voltage electron microscopes

(LVEMs)

Miniaturization of electronic devices

Increased adoption in automobile sector

PART 13: Vendor landscape

Competitive scenario

Vendor analysis

Other prominent vendors

PART 14: Appendix

List of abbreviations

PART 15: Explore Technavio

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