关键词：扫描探针显微镜（SPM）；高原子分辨率；物理探针的分支；扫描试样；高放大倍率；测量；三维表面形貌
摘 要：Scanning probe microscopy (SPM) was introduced in 1981 as the first technology to provide high atomic resolution. It is a branch of microscopy that uses a physical probe to scan a specimen. SPM microscopes provide high magnification to obtain a 3D image of a specimen. Initially, SPM microscopes were mainly used to measure 3D surface topography. Although they can now be used to measure other surface properties, they are still primarily used for 3D topography. These microscopes were the first to produce real-space images of atomic arrangements on flat surfaces. They form images of surfaces by moving the sharp probe over the sample. The interaction between the probe and the sample and the pressure created by the probe on the sample is monitored, which determine the image resolution.
目 录：

PART 01: Executive summary

Highlights

PART 02: Scope of the report

Market overview

Top-vendor offerings

PART 03: Market research methodology

Research methodology

Economic indicators

PART 04: Introduction

Key market highlights

PART 05: Market at a glance

PART 06: Market landscape

Market overview

Market size and forecast

Five forces analysis

PART 07: Market segmentation by application

Market overview

Semiconductors

Life sciences

Materials science

Nanotechnology

PART 08: Market segmentation by product

Market overview

AFM

STM

Others

PART 09: Geographical segmentation

Market overview

Americas

EMEA

APAC

PART 10: Market drivers

Increased applications in life sciences

Rise in nanotechnology applications

Increased spending by governments

Advances in technology

PART 11: Impact of drivers

PART 12: Market challenges

Budgetary constraints

Need for customized products

High cost of professional SPM microscopes

Limitations of AFM devices

PART 13: Impact of drivers and challenges

PART 14: Market trends

Novel image-optimizing techniques

Introduction of hybrid AFM modes

Growing number of CROs

PART 15: Vendor landscape

Competitive scenario

Key vendor analysis

Other prominent vendors

PART 16: Key vendor analysis

Asylum Research

Hitachi High-Technologies

Keysight Technologies

NT-MDT

Park Systems

PART 17: Appendix

List of abbreviations

PART 18: Explore Technavio